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2013 Fiscal Year Final Research Report

The development of 3D electron bunch monitor with femtosecond resolution

Research Project

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Project/Area Number 23360045
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Applied physics, general
Research InstitutionJapan Synchrotron Radiation Research Institute

Principal Investigator

TOMIZAWA Hiromitsu  公益財団法人高輝度光科学研究センター, XFEL利用研究推進室, 副主幹研究員 (40344395)

Co-Investigator(Kenkyū-buntansha) DEWA Hideki  (公財)高輝度光科学研究センター, 加速器部門, 副主幹研究員 (20360836)
SUZUKI Shinsuke  (公財)高輝度光科学研究センター, 加速器部門, 主幹研究員 (00416380)
TOGASHI Tadashi  (公財)高輝度光科学研究センター, XFEL 利用研究推進室, 研究員 (60415239)
MATSUBARA Shinichi  (公財)高輝度光科学研究センター, XFEL 利用研究推進室, 研究員 (90532135)
OKAYASU Yuichi  (公財)高輝度光科学研究センター, 加速器部門, 研究員 (90509910)
MINAMIDE Hiroaki  (独)理化学研究所, テラヘルツ光源研究チーム, チームリーダー (10322687)
TANIUCHI Tsutomu  (公財)高輝度光科学研究センター, 加速器部門, 副主幹研究員 (60360822)
Co-Investigator(Renkei-kenkyūsha) MIZUNO Akihiko  (公財)高輝度光科学研究センター, 加速器部門, 副主幹研究員 (30360829)
YANAGIDA Kenichi  (公財)高輝度光科学研究センター, 加速器部門, 主幹研究員 (10529564)
Project Period (FY) 2011-04-01 – 2014-03-31
KeywordsEOサンプリング / 有機EO結晶 / シードFEL / 3次元バンチ形状モニター / シングルショット・フェムト秒バンチ計測 / EOサンプリングの空間多重化 / EOサンプリングの波長多重化 / 電荷モーメント
Research Abstract

3D-BCD monitor enables non-destructive measurements of the longitudinal and transverse BCD at the same time. We verified this transverse detection with multiple EO crystals at SPring-8 photoinjector test accelerator. In the high-order harmonics (HH) FEL seeding, it is required to maximize and keep 6D-phase-space overlapping between HH-laser pulse and electron bunch. We constructed a relative timing drift monitor based on EO-sampling, which measured the timing differences between the seeding HH-laser pulse and the electron bunch, using a common external laser source of both HH-driving and EO-probing pulses. Keeping the peak wavelength of EO signals at the same wavelength with our feedback system, we provided seeded FEL pulses with a 20-30% hit rate during pilot user experiments. For achieving the upper limit of temporal resolution, we developed high-temporal-response EO-detector crystals and an octave broadband probe laser pulse with a linear chirp rate of 1 fs/nm (flattop spectrum).

  • Research Products

    (7 results)

All 2013 2012 Other

All Journal Article (3 results) (of which Peer Reviewed: 3 results) Presentation (2 results) Remarks (1 results) Patent(Industrial Property Rights) (1 results)

  • [Journal Article] Feasibility study of a single-shot 3D electron bunch shape monitor with an Electro-Optic sampling technique2013

    • Author(s)
      岡安雄一,冨澤宏光,松原伸一,熊谷教孝, 前川陽, 上坂充, 石川哲也
    • Journal Title

      Phys. Rev. ST Accel. Beams

      Volume: Vol.16 Pages: 052801-052812

    • DOI

      10.1103/PhysRevSTAB.16.052801

    • Peer Reviewed
  • [Journal Article] 高輝度光陰極を実現する先端レーザ技術2012

    • Author(s)
      冨澤宏光
    • Journal Title

      Journal of the Vacuum Society of Japan

      Volume: Vol.55 No.2 Pages: 50-58

    • DOI

      10.3131/jvsj2.55.50

    • Peer Reviewed
  • [Journal Article] Design study of beam position monitors for measuring second-order moments of charged particle beams2012

    • Author(s)
      柳田謙一,鈴木伸介,花木博文
    • Journal Title

      Phys. Rev. ST Accel. Beams

      Volume: Vol.15 Pages: 012801-012809

    • DOI

      10.1103/PhysRevSTAB.15.012801

    • Peer Reviewed
  • [Presentation] The First Demonstration of EOS 3D-BCD Monitor to Maximize 3DOverlapping for HHG-Seeded FEL2013

    • Author(s)
      冨澤宏光,富樫格,小川奏,田中均,矢橋牧名,松原伸一,岡安雄一,石川哲也
    • Organizer
      IBIC2013
    • Place of Presentation
      Oxford UK
    • Year and Date
      20130916-19
  • [Presentation] 表面プラズモン共鳴を介した電子バンチのEO計測技術の展望2013

    • Author(s)
      岡安雄一,松原伸一,冨澤宏光,小川 奏,南出泰亜,松川健
    • Organizer
      第68回日本物理学会年次大会
    • Place of Presentation
      広島大学
    • Year and Date
      20130327-30
  • [Remarks] 受賞等(計2件) 名称:第7回大阪大学近藤賞 技術貢献賞 受賞者:冨澤宏光,青山誠,岩崎純史,高橋栄治,富樫格 受賞年月日:平成25年5月8日

  • [Patent(Industrial Property Rights)] ビーム測定装置,ビーム測定方法,及びそれを用いたポンプ・プローブ測定方法2012

    • Inventor(s)
      冨澤宏光
    • Industrial Property Rights Holder
      (公財)高輝度光科学研究センター
    • Industrial Property Rights Type
      特許
    • Industrial Property Number
      特許第5165278号
    • Acquisition Date
      2012-12-28

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Published: 2015-06-25  

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