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2012 Fiscal Year Final Research Report

evelopment of multi-dimensional endoscope

Research Project

  • PDF
Project/Area Number 23760235
Research Category

Grant-in-Aid for Young Scientists (B)

Allocation TypeMulti-year Fund
Research Field Intelligent mechanics/Mechanical systems
Research InstitutionSaitama Medical University

Principal Investigator

WAKAYAMA Toshitaka  埼玉医科大学, 保健医療学部, 准教授 (90438862)

Project Period (FY) 2011 – 2012
Keywords内視鏡 / 三次元 / 分光 / 偏光
Research Abstract

I have developed a novel endoscope obtained its properties and conditions with inner profile. This study was achieved optical biopsy imaging from spectrum information and three dimensional profile measurement. To overcome uni-axial measurement, it is possible to measure inner profile surface from confocal technique, precisely. I have developed novel optical elements after I discovered unique polarized phenomena by process for fabricating conical mirror and lens as element technologies.

  • Research Products

    (15 results)

All 2013 2012 2011

All Journal Article (4 results) (of which Peer Reviewed: 4 results) Presentation (8 results) Patent(Industrial Property Rights) (3 results) (of which Overseas: 1 results)

  • [Journal Article] Achromatic Axially Symmetric Wave Plates2012

    • Author(s)
      T.Wakayama, K. Komaki, Y. Otani, T.Yoshizawa
    • Journal Title

      Opt. Express

      Volume: 20 Pages: 29260-29265

    • Peer Reviewed
  • [Journal Article] Small size probe for inner profile measurement of pipes using optical fiber ring beam device2012

    • Author(s)
      T.Wakayama, K.Machi, T.Yoshizawa
    • Journal Title

      Proc. SPIE

      Volume: 85630L Pages: 85630L, 85630L-1-85630L-7

    • Peer Reviewed
  • [Journal Article] An interferometric observation of topological effect by novel axially symmetrical wave plate2012

    • Author(s)
      T.Wakayama, Y.Otani, T.Yoshizawa
    • Journal Title

      Proc.SPIE

      Volume: 849306 Pages: 849306-1-849306-8

    • Peer Reviewed
  • [Journal Article] Development of a probe for inner profile measurement and flaw detectiona2011

    • Author(s)
      T.Yoshizawa, T.Wakayama, Y.Kamakura
    • Journal Title

      Proc.SPIE

      Volume: 81330D Pages: 81330D-1-81330D-6

    • Peer Reviewed
  • [Presentation] 同軸内面形状計測2013

    • Author(s)
      若山俊隆,吉澤徹
    • Organizer
      精密工学会春季大会
    • Place of Presentation
      東京工業大学,東京
    • Year and Date
      2013-03-13
  • [Presentation] 光ファイバを導入した内面形状計測用細径プローブ2012

    • Author(s)
      若山俊隆,間地築,吉澤徹
    • Organizer
      光計測シンポジウム
    • Place of Presentation
      機械振興会館,東京
    • Year and Date
      2012-11-16
  • [Presentation] Small size probe for inner profile measurement of pipes using optical fiber ring beam device2012

    • Author(s)
      T.Wakayama, K.Machi, T.Yoshizawa
    • Organizer
      in Optical Metrology and Inspection for Industrial Applications II of SPIE international conference
    • Place of Presentation
      SanDiego, USA
    • Year and Date
      2012-11-05
  • [Presentation] An interferometric observation of topological effect by novel axially symmetrical wave plate2012

    • Author(s)
      T.Wakayama, Y.Otani, T.Yoshizawa
    • Organizer
      in Interferometry XVI of SPIE international conference
    • Place of Presentation
      SanDiego, USA
    • Year and Date
      2012-08-12
  • [Presentation] アクロマティック軸対称波長板の開発2012

    • Author(s)
      若山俊隆,大谷幸利,吉澤徹
    • Organizer
      応用物理学会春季大会
    • Place of Presentation
      早稲田大学,東京
    • Year and Date
      2012-03-17
  • [Presentation] 内面計測用小型三次元プローブの開発(第5報)- 光ファイバ・リングビームプローブの導入2012

    • Author(s)
      若山俊隆,吉澤徹
    • Organizer
      精密工学会春季大会
    • Place of Presentation
      首都大学東京,東京
    • Year and Date
      2012-03-14
  • [Presentation] 分光三次元内視鏡に関する研究2012

    • Author(s)
      齊藤菜都美,若山俊隆,吉澤徹
    • Organizer
      精密工学会春季大会
    • Place of Presentation
      首都大学東京,東京
    • Year and Date
      2012-03-14
  • [Presentation] Development of a probe for inner profile measurement and flaw detection2011

    • Author(s)
      T.Yoshizawa, T.Wakayama, Y.Kamakura
    • Organizer
      in Dimensional Optical Metrology and Inspection for Practical Applications of SPIE international conference
    • Place of Presentation
      SanDiego, USA
    • Year and Date
      2011-08-29
  • [Patent(Industrial Property Rights)] 軸対称偏光変換素子2013

    • Inventor(s)
      若山俊隆,大谷幸利,吉澤徹
    • Industrial Property Rights Holder
      埼玉医科大学,宇都宮大学
    • Industrial Property Number
      PCT/JP2013/52834
    • Filing Date
      2013-02-08
    • Overseas
  • [Patent(Industrial Property Rights)] 形状計測装置2013

    • Inventor(s)
      若山俊隆
    • Industrial Property Rights Holder
      埼玉医科大学
    • Industrial Property Number
      特願2013-026271
    • Filing Date
      2013-02-14
  • [Patent(Industrial Property Rights)] 軸対称偏光変換素子2012

    • Inventor(s)
      若山俊隆,大谷幸利,吉澤徹
    • Industrial Property Rights Holder
      埼玉医科大学,宇都宮大学
    • Industrial Property Number
      特願2012-025150
    • Filing Date
      2012-02-08

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Published: 2014-09-25  

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