Local atomic structure analysis of ferromagnetic semiconductor using photoelectron holography

2014 Fiscal Year Final Research Report

• Project/Area Number: 24560016
• Research Category: Grant-in-Aid for Scientific Research (C)
• Allocation Type: Multi-year Fund
• Section: 一般
• Research Field: Applied materials science/Crystal engineering
• Research Institution: Hiroshima City University
• Principal Investigator: HAPPO Naohisa 広島市立大学, 情報科学研究科, 准教授 (30285431)
• Project Period (FY): 2012-04-01 – 2015-03-31
• Keywords: 希薄磁性半導体 / スピントロニクス材料 / 原子分解能ホログラフィー / 放射光利用測定技術

Outline of Final Research Achievements

In order to investigate a crystal structure around a Te atom in a ferromagnetic semiconductor Ge1-xMnxTe, we measured the Te 4d photoelectron intensity angular distribution (PIAD) pattern using a display-type spherical mirror analyzer (DIANA) at BL25SU of SPring-8. As a result, the change from a rhombohedral structure (x = 0) to a NaCl-type structure (x = 0.4) could be observed. And fluctuations of Te positions were observed in the reconstructed atomic image obtained from the Te 4d photoelectron hologram. The result supports our previous X-ray fluorescence holography results.

Free Research Field

理工系・工学