Interfacial Liquids Probed by Frequency-Modulation Atomic Force Microscopy

2015 Fiscal Year Final Research Report

• Project/Area Number: 25286009
• Research Category: Grant-in-Aid for Scientific Research (B)
• Allocation Type: Partial Multi-year Fund
• Section: 一般
• Research Field: Nanostructural physics
• Research Institution: Kobe University
• Principal Investigator: Onishi Hiroshi 神戸大学, 理学(系)研究科(研究院), 教授 (20213803)
• Co-Investigator(Kenkyū-buntansha): AMANO Ken-ichi 京都大学, 大学院工学研究科, 助教 (30634191)
• Research Collaborator: Foster Adam アールト大学(フィンランド), 応用物理学科, 准教授
• Project Period (FY): 2013-04-01 – 2016-03-31
• Keywords: 固液界面 / 原子間力顕微鏡 / 力学応答 / 液体構造 / 統計力学 / 分子動力学シミュレーション / 結晶成長 / トライボロジー

Outline of Final Research Achievements

Frequency-modulation atomic force microscopy (FM-AFM) provides a promising tool to observe the solid topography and also liquid structure at liquid-solid interfaces. The cantilever with a tip is mechanically oscillated. Force pushing or pulling the tip shifts the resonance frequency of the oscillation. Microscopes with force sensitivity of 10 pN or better in water have been developed and commercialized to date. In this study, two-dimensional frequency-shift distributions observed at interfaces including water-calcite were interpreted with Gibbs free energy distribution perturbed by solid surfaces.

Free Research Field

界面分子科学