Development of EMC Countermeasure against fault injection based attack and intentional electromagnetic interference

2015 Fiscal Year Final Research Report

• Project/Area Number: 25289068
• Research Category: Grant-in-Aid for Scientific Research (B)
• Allocation Type: Partial Multi-year Fund
• Section: 一般
• Research Field: Power engineering/Power conversion/Electric machinery
• Research Institution: Tohoku University
• Principal Investigator: SONE Hideaki 東北大学, サイバーサイエンスセンター, 教授 (40134019)
• Co-Investigator(Kenkyū-buntansha): HAYASHI Yu-ichi 東北学院大学, 工学部, 准教授 (60551918) ; MIZUKI Takaaki 東北大学, サイバーサイエンスセンター, 准教授 (90323089)
• Project Period (FY): 2013-04-01 – 2016-03-31
• Keywords: 電気機器工学 / 情報通信工学 / 電気・電磁環境 / 電磁的情報セキュリティ / 暗号 / 故障利用攻撃 / 環境電磁工学 / 意図的電磁妨害

Outline of Final Research Achievements

This research project presented a new type of transient fault injection based on IEMI that causes information leakage from cryptographic modules without disrupting their operation. Moreover, the mechanism of IEMI fault injection is explained from the viewpoint of Electromagnetic Compatibility (EMC): We demonstrate the consequence of the mechanism through experiments and full wave simulations. Based on the mechanism, we proposed electric-level countermeasures against this kind of fault injection attacks.

Free Research Field

情報通信工学