Research on the Fuse Element Pattern Changing a Current Pathway in the Process of Current Interruption

2015 Fiscal Year Final Research Report

• Project/Area Number: 25420242
• Research Category: Grant-in-Aid for Scientific Research (C)
• Allocation Type: Multi-year Fund
• Section: 一般
• Research Field: Power engineering/Power conversion/Electric machinery
• Research Institution: Saitama University
• Principal Investigator: YAMANO Yasushi 埼玉大学, 理工学研究科, 准教授 (30323380)
• Project Period (FY): 2013-04-01 – 2016-03-31
• Keywords: ヒューズ / 半導体保護用ヒューズ / パワーエレクトロニクス / 短絡保護 / 電流遮断

Outline of Final Research Achievements

Protection techniques for the semiconductors are regarded as an important issue, because power semiconductor devices are indispensable for electric power control systems. This paper reports new type of etched fuse element pattern which has possibility of improving the current interruption performance. Newly developed fuse element has the network current pathway on the ceramic substrate, and the pathway automatically changes rapidly when the short current flows. We named this fuse Intelligent Fuse. The basic design of the element of the Intelligent Fuse and the results of the interruption test are described. Some kinds of test fuse elements were prepared and the interruption tests were done under the short circuit current. The result shows the fault current pathway could be commutated from the ordinary current path by altering the number of the series interruption points. In addition, it is found that this commutation of the current pathway contributed to interruption of fault current.

Free Research Field

工学