Study on LSI design methods for security and testability

2014 Fiscal Year Final Research Report

• Project/Area Number: 25540020
• Research Category: Grant-in-Aid for Challenging Exploratory Research
• Allocation Type: Multi-year Fund
• Research Field: Computer system
• Research Institution: Kyoto Sangyo University (2014); Kyushu University (2013)
• Principal Investigator: YOSHIMURA Masayoshi 京都産業大学, コンピュータ理工学部, 准教授 (90452820)
• Project Period (FY): 2013-04-01 – 2015-03-31
• Keywords: 安全 / 信頼性 / LSI設計技術 / 暗号LSI / 製造テスト / テストパタン生成 / テスト容易化設計

Outline of Final Research Achievements

The scan design method makes it possible to increase testability. Scan-based Attacks with scan design decrease security for confidential information on LSIs. Conventional methods provide assurance of security with complicated scan designs. If information about complicated scan designs, attackers could obtain confidential information on LSIs by using scan-based attacks. Complicated scan designs is a novel confidential information.
We proposed a design method with both testability and security without depending on complicated scan designs. The proposed method is a design method which ensures testability on behavior level testability without scan design. Several designs were applied to the proposed methods. We measured quantitatively the security for the designs applied to the proposed method. The measure for security evaluation is mutual information.

Free Research Field

情報工学