Study of surface physical properties using newly-built REM-AFM holder with strain force applying system

2014 Fiscal Year Final Research Report

• Project/Area Number: 25600017
• Research Category: Grant-in-Aid for Challenging Exploratory Research
• Allocation Type: Multi-year Fund
• Research Field: Nanostructural physics
• Research Institution: Osaka University
• Principal Investigator: NATIOH Yoshitaka 大阪大学, 工学(系)研究科(研究院), 助教 (90362665)
• Project Period (FY): 2013-04-01 – 2015-03-31
• Keywords: 表面界面物性 / 走査プローブ顕微鏡 / 電子顕微鏡

Outline of Final Research Achievements

In order to investigate the correlated changes of the atomic bonding state and electronic state of a surface when applying the macroscopic strain field on it, I specially designed and produced the atomic force microscopy holder working in an electron microscope, which equipped with the strain force applying system. I successfully imaged the gap between an AFM tip and a Si(111) surface by reflection electron microscopy. In addition, I developed useful techniques for probing the individual atomic bonding state of the surface spatially and acquiring surface electron charge state with high sensitivity.

Free Research Field

表面界面