2014 Fiscal Year Final Research Report
Study of surface physical properties using newly-built REM-AFM holder with strain force applying system
Project/Area Number |
25600017
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Research Category |
Grant-in-Aid for Challenging Exploratory Research
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Allocation Type | Multi-year Fund |
Research Field |
Nanostructural physics
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Research Institution | Osaka University |
Principal Investigator |
NATIOH Yoshitaka 大阪大学, 工学(系)研究科(研究院), 助教 (90362665)
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Project Period (FY) |
2013-04-01 – 2015-03-31
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Keywords | 表面界面物性 / 走査プローブ顕微鏡 / 電子顕微鏡 |
Outline of Final Research Achievements |
In order to investigate the correlated changes of the atomic bonding state and electronic state of a surface when applying the macroscopic strain field on it, I specially designed and produced the atomic force microscopy holder working in an electron microscope, which equipped with the strain force applying system. I successfully imaged the gap between an AFM tip and a Si(111) surface by reflection electron microscopy. In addition, I developed useful techniques for probing the individual atomic bonding state of the surface spatially and acquiring surface electron charge state with high sensitivity.
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Free Research Field |
表面界面
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