Femtosecond time-resolved electron microscopy

2016 Fiscal Year Final Research Report

• Project/Area Number: 26246026
• Research Category: Grant-in-Aid for Scientific Research (A)
• Allocation Type: Single-year Grants
• Section: 一般
• Research Field: Thin film/Surface and interfacial physical properties
• Research Institution: Osaka University
• Principal Investigator: Yang Jinfeng 大阪大学, 産業科学研究所, 准教授 (90362631)
• Co-Investigator(Kenkyū-buntansha): 吉田 秀人 大阪大学, 産業科学研究所, 准教授 (00452425)
• Project Period (FY): 2014-04-01 – 2017-03-31
• Keywords: 電子顕微鏡 / 時間分解電子顕微鏡 / 高速電子線回折 / フェムト秒イメージング / ビーム応用

Outline of Final Research Achievements

Ultrafast observation technique with femtosecond and nanometer temporal- spatial resolutions would be very significant in material science and applications. We have designed and developed a first prototype of ultrafast electron microscopy (UEM) using a femtosecond-pulse and relativistic-energy electron beam. The femtosecond-pulse electron beam with the energy of 3 MeV and the pulse length of 100 fs have been generated using a radio-frequency electron gun. We succeeded to observe TEM images of gold and polystyrene nanoparticles in our UEM using the MeV-energy femtosecond electron pulses. In the ultrafast electron diffraction measurement, the single-shot observation is available. It would be very promising for studying the irreversible structural dynamics and making new discoveries in material science.

Free Research Field

加速器科学、電子顕微鏡、ビーム応用