High-resolution integrated spatial/electronic structure analysis of localized functional defects by multi-dimensional spectroscopy with reciprocal space scanning

2017 Fiscal Year Final Research Report

• Project/Area Number: 26249096
• Research Category: Grant-in-Aid for Scientific Research (A)
• Allocation Type: Single-year Grants
• Section: 一般
• Research Field: Inorganic materials/Physical properties
• Research Institution: Nagoya University
• Principal Investigator: Muto Shunsuke 名古屋大学, 未来材料・システム研究所, 教授 (20209985)
• Co-Investigator(Kenkyū-buntansha): 大塚 真弘 名古屋大学, 工学研究科, 助教 (60646529) ; 巽 一厳 名古屋大学, 未来材料・システム研究所, 准教授 (00372532)
• Research Collaborator: Rusz Jan ウプサラ大学, 天文物理学科, 准教授
• Project Period (FY): 2014-04-01 – 2018-03-31
• Keywords: 電子顕微鏡 / 電子顕微分光 / 情報統計学 / 機械学習 / 機能元素 / ナノ材料 / ナノ磁性 / 質量分析

Outline of Final Research Achievements

In this study we developed state-of-the-art methods that enable physical properties analysis and thier chemical imaging of functional materials at nanometer scale by combining multiple electron spectroscopic methods associated with scanning transmission electron microscopy. The method involves information/statistical methods to process the obtained big size datasets. The methods applied to analyses of environmental, energy, magnetic and biological materials, thereby clarifying the site occupancies and chemical states of dopant elements in manners that the conventional diffraction and microscopic methods have never accessed.

Free Research Field

無機材料物性