Development of fast XRF elemental imaging spectrometer

2016 Fiscal Year Final Research Report

• Project/Area Number: 26288069
• Research Category: Grant-in-Aid for Scientific Research (B)
• Allocation Type: Partial Multi-year Fund
• Section: 一般
• Research Field: Analytical chemistry
• Research Institution: Osaka City University
• Principal Investigator: TSUJI Kouichi 大阪市立大学, 大学院工学研究科, 教授 (30241566)
• Project Period (FY): 2014-04-01 – 2017-03-31
• Keywords: Ｘ線 / 可視化 / 解析・評価 / イメージング

Outline of Final Research Achievements

XRF imaging spectrometer based on wavelength dispersive analysis was developed. The distance between the sample and analyzing crystal was shortened. As a result, the special resolution was improved. Using a new sample stage installed, the large sample area was scanned and analyzed during the WDXRF imaging. Furthermore, a highly sensitive 2D detector was installed for a fast XRF imaging. It was demonstrated that main elements in the bulk sample were imaged in a short time less than 1 s. Using this fast imaging, this technique was applied for imaging the Pb and Cu in the electric devices as well as monitoring the elemental dissolving process of metals in acid solutions.

Free Research Field

Ｘ線分光分析