2017 Fiscal Year Final Research Report
Studies on Reliability Enhancement of Circuits Programmed on FPGAs
| Project/Area Number |
26330067
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Multi-year Fund |
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| Section | 一般 |
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| Research Field |
Computer system
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| Research Institution | Oita University |
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Principal Investigator |
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| Research Collaborator |
SATO Shuichi
MORIYASU Takanori
HONDA Taro
ONO Renji
KANO Sho
SAWAKI Kosuke
UEDA Hiroki
SHIMAZU Daichi
MINAMIZONO Hayato
WATANABE Kyonosuke
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| Project Period (FY) |
2014-04-01 – 2018-03-31
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| Keywords | FPGA / フィールドテスト / 特定用途依存テスト / 遅延故障 / 故障診断 / BIST / 対故障設計 / 劣化検知 |
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| Outline of Final Research Achievements |
Recently, production cost of small quantity production of integrated circuits tends to increase. For reduction of production cost, instead of producing a small amount of application specific integrated circuits, field programmable gate arrays (FPGAs) are expected to be used even for critical application fields.
We conducted studies on reliability enhancement of FPGAs and proposed several techniques to test integrated circuits programmed on the FPGAs in-field.
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| Free Research Field |
計算機科学
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