Precise Structure Analysis of Multi-Components Origanic Thin Films by Grazing Incidence X-ray Scattering utilizing Wide Energy X-rays

2016 Fiscal Year Final Research Report

• Project/Area Number: 26410132
• Research Category: Grant-in-Aid for Scientific Research (C)
• Allocation Type: Multi-year Fund
• Section: 一般
• Research Field: Polymer chemistry
• Research Institution: Nagoya Institute of Technology
• Principal Investigator: Yamamoto Katsuhiro 名古屋工業大学, 工学(系)研究科(研究院), 准教授 (30314082)
• Project Period (FY): 2014-04-01 – 2017-03-31
• Keywords: 斜入射小角X線散乱 / 高分子薄膜 / 相分離構造 / テンダーX線 / 異常小角散乱

Outline of Final Research Achievements

Grazing Incidence X-ray Scattering (GISAXS) method is powerful tool to analyze mesoscpic structures in organic (polymer) thin films. Ordinaly, hard X-rays (1-1.5A) are often used for GISAXS method. In recent, wide ragne of X-ray between 2 to 14 keV has been deveploed and normally available for GISAXS in the Japanese synchrotron facility. Utilizing X-rays near the adorption edge of taget elements revealed spacial distribution of the target elements in thin films. Tender X-rays enebles to analyze tepth-resolved structure in the thin films. We found that different between the nano-structures near the surface and in vicinity of the substrate.

Free Research Field

高分子科学