Project/Area Number |
09559006
|
Research Category |
Grant-in-Aid for Scientific Research (B)
|
Allocation Type | Single-year Grants |
Section | 展開研究 |
Research Field |
広領域
|
Research Institution | Japan Advanced Institute of Science and Technology, Hokuriku |
Principal Investigator |
SASAKI Shintaro Japan Advanced Institute of Science and Technology, School of Materials Science, Professor, 材料科学研究科, 教授 (10092553)
|
Co-Investigator(Kenkyū-buntansha) |
SASAKI Katsunari Rigaku Corporation, システム設計部, 技術補
|
Project Period (FY) |
1997 – 1999
|
Project Status |
Completed (Fiscal Year 1999)
|
Budget Amount *help |
¥12,600,000 (Direct Cost: ¥12,600,000)
Fiscal Year 1999: ¥1,000,000 (Direct Cost: ¥1,000,000)
Fiscal Year 1998: ¥1,100,000 (Direct Cost: ¥1,100,000)
Fiscal Year 1997: ¥10,500,000 (Direct Cost: ¥10,500,000)
|
Keywords | X-ray diffraction / image plate / polymer / crystal structure analysis / crystallinity / 画像処理 / 配向 / X線回析 / 構造解析 / 高分子 |
Research Abstract |
An analytical system working on personal computers was developed to treat numerical data of X-ray diffraction patterns measured with a planar and a cylindrical image-plate detectors. The most striking feature is that the polymer fiber samples are not necessarily oriented to be normal to the incident X-ray beam. The geometry of sample orientation can be defined with the aid of the positions of reflections. Data collection including calculations of reciprocal-lattice coordinates, background separation, Lorentz and other essential corrections, and peak detection are processed for the inclined geometry. For uniaxially-oriented polymer samples, the meridional reflections exist in a sort of singular position, and therefore their intensity data have not been collected for the crystal structure analysis. This singularity problem is resolved in the present system. If the oriented sample were just tilted so as to give a certain meridional reflection, its integral intensity corrected for the Lorentz factor is obtained accurately without the conventional singularity on meridians. The radial, azimuthal, and layer-line intensity distributions are extracted, and served to analyze the degree of orientation, crystallinity, and disorders involved in the crystallites. This system was applied for analyses of poly(p-phenylene sulfide) and poly(L-lactic acid), π-conjugated electro-conductive polymers, and comb-like polymers.
|