1991 Fiscal Year Final Research Report Summary
The phase diagrams of the CdS-CdSe-CdTe pseudoternary system at 708゚C, 758゚C and 808゚C
Project/Area Number |
02650488
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Research Category |
Grant-in-Aid for General Scientific Research (C)
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Allocation Type | Single-year Grants |
Research Field |
金属精錬・金属化学
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Research Institution | Waseda University |
Principal Investigator |
KATO Eiichi Waseda University, Department of Material Science and Engineering, Professor, 理工学部, 教授 (30063233)
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Project Period (FY) |
1990 – 1991
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Keywords | Phase Diagram / X-Ray diffraction / Mass spectorometry / II-VI Compound Semiconductors / Lattice constant |
Research Abstract |
The phase diagrams of the CdS-CdSe-CdTe pseudoternary system at 708゚C, 758゚C and 808゚C were investigated by X-ray diffraction measurement. The samples were annealed at each temperatures for 1000 hours and quenched. At 808゚C zincblende type single-phase region, wurtzite single-phase region and two two-phase regions exist. At 758゚C and 708゚C zincblend type single-phase region, wurtzite type single-phase region and a two-phase region exist. And an isothermal evaporation method by means of a Knudsen cell-mass spectrometer combination has been applied to the determination of the phase boundary of the CdS rich side in the CdS-CdSe-CdTe system at the temperature of 688゚C. The phase boundary was determined by measuring the change of ion intensities as a function of composition.
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Research Products
(2 results)