2017 Fiscal Year Final Research Report
Investigation of Au Atomic Junctions Using Ultrafast Electromigration Controlled by a Field-Programmable Gate Array
Project/Area Number |
15H03970
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Research Category |
Grant-in-Aid for Scientific Research (B)
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Allocation Type | Single-year Grants |
Section | 一般 |
Research Field |
Electronic materials/Electric materials
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Research Institution | Tokyo University of Agriculture and Technology |
Principal Investigator |
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Project Period (FY) |
2015-04-01 – 2018-03-31
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Keywords | マイクロ・ナノデバイス / FPGA / エレクトロマイグレーション / 単原子トランジスタ / 原子接合 / 原子ギャップ |
Outline of Final Research Achievements |
A field-programmable gate array (FPGA) contains a matrix of reconfigurable gate array logic circuitry. FPGA-based systems can thus perform deterministic closed-loop control tasks at extremely fast loop rates. In this study, we presented the design of a new feedback-controlled electromigration (FCE) system using an FPGA. In addition, we applied the system for fabrication of Au atomic junctions and atomic gaps. Single-electron transistors (SETs) arrays operating at room temperature were also fabricated using the method. These results clearly imply that FPGA-based electromigration procedure is suitable for formation of Au atomic junctions, atomic gaps and SET arrays.
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Free Research Field |
ナノエレクトロニクス、ナノテクノロジー
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