2013 Fiscal Year Final Research Report
Design of dependable Analog Mixed-Signal LSI with intermittent operation of fault detection system
| Project/Area Number |
23500067
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Multi-year Fund |
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| Section | 一般 |
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| Research Field |
Computer system/Network
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| Research Institution | Kochi University of Technology |
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Principal Investigator |
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| Project Period (FY) |
2011 – 2013
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| Keywords | ディペンダブルコンピューティング / Analog Mixed-Signal |
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| Research Abstract |
We propose fault-based BIST(Built-In Self Test) schemes for Anlog part of AMS(Analog Mixed-Signal) system LSI. The BIST systems can be used throughout life time of LSIs, from fabrication process to the system's operation. The motif of analog system to design BIST system is Anlog-to-Digital or Digital-to-Analog data convertor which is commonly used sub-system in AMS LSI systems.
We chose 3 types of circuits which compose the data convertor, which are R-2R ladder type Digital-to-Analog convetor, Fully-differential sample-and-hold circuit, and Operational Amplifers with different architectures. The BIST systems are based on transient respose of circuits and fault coverage for Caterstrofic faults, such like open/short fault of circuit elements, are about 86% to 96% with resonable area overhead.
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