2011 Fiscal Year Final Research Report
Development of multi-probe microscope for measuring electrical conductivity under local high pressures in nano-scale
| Project/Area Number |
22686006
|
|---|
| Research Category |
Grant-in-Aid for Young Scientists (A)
|
| Allocation Type | Single-year Grants |
|---|
| Research Field |
Thin film/Surface and interfacial physical properties
|
|---|
| Research Institution | University of Yamanashi |
|---|
Principal Investigator |
SHIRAKI Ichiro 山梨大学, 大学院・医学工学総合研究部, 准教授 (10399389)
|
|---|
| Project Period (FY) |
2010 – 2011
|
| Keywords | 走査プローブ顕微鏡 |
|---|
| Research Abstract |
It is well known that both of electrical and magnetic characteristics of materials change as inducing high pressures. The development of new methods of the measurement of local electrical conductivity and the related basic materials research were performed. The instrument for the new methods, named as "multi-probe microscope for measuring electrical conductivity under local highpressures in nano-scale", is expected to encourage the research of functional nano devices and nano wires. For the materials basic research, SrTiO_3(100) surface was observed in atomic scale and discussed to clarify the atomic structures.
|
